Synthesis-Directed Sequential Test
??Entire-chip full-scan-based design-for-test will be obsolete by the end of the 1990s
?? Will be used for some very-specific on-chip structures (e.g. ROM, RAM, maybe Datapath) and for some chip boundaries.
??Circuit-structure-specific and BILBO-like test styles will continue to be used for go-nogo tests.
??Architectural memory structures will continue to be accessible directly for the pins.