Synthesis-Directed Sequential Test
Synthesis-Directed Sequential Test
m Full-scan-based design-for-test will be obsolete in 5-7 years
Ô Will be used for some very-specific structures
m Test will be incorporated directly in the synthesis process
Ô Guaranteed fully-testable non-scan or partial-scan designs will be produced by the synthesis process.Ô A complete set of test patterns will be a by-product of the process
m Circuit-structure-specific and BILBO-like test styles will remain for go-nogo tests.