The year 1991 yielded publications that disseminated key techniques to measure the frequency response and other attributes of micromechanical resonators, whether in air (low Q<\/em>) or vacuum (high Q<\/em>). This is where the art of MEMS measurement to circumvent masking parasitics began and culminated with both the Gated Sinusoid and Electromechanical Amplitude Modulation (EAM) techniques.<\/p>\n\n\n\n
C. T.-C. Nguyen and R. T. Howe, \u201cElectromechanical characterization of microresonators for circuit applications<\/a>,\u201d Tech. Dig<\/em>., MICRO Program, 1991.<\/p>\n\n\n\n
C. T.-C. Nguyen, \u201cElectromechanical characterization of microresonators for circuit applications<\/a>,\u201d M. S. Report, Dept. of Electrical Engineering and Computer Sciences, University of California at Berkeley, April 1991.<\/p>\n","protected":false},"excerpt":{"rendered":"