A Theory of Mutations with Applications to Vacuity, Coverage, and Fault Tolerance

Orna Kupferman, Wenchao Li, and Sanjit A. Seshia. A Theory of Mutations with Applications to Vacuity, Coverage, and Fault Tolerance. In Proceedings of the IEEE International Conference on Formal Methods in Computer-Aided Design (FMCAD), pp. 1–9, November 2008.

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Abstract

The quality of formal specifications and the circuitsthey are written for can be evaluated through checks such asvacuity and coverage. Both checks involve mutations to thespecification or the circuit implementation. In this context, westudy and prove properties of mutations to finite-state systems.Since faults can be viewed as mutations, our theory of mutationscan also be used in a formal approach to fault injection. Wedemonstrate theoretically and with experimental results howrelations and orders amongst mutations can be used to improvespecifications and reason about coverage of fault tolerant circuits.

BibTeX

@inproceedings{kupferman-fmcad08,
 author = {Orna Kupferman and Wenchao Li and Sanjit A. Seshia},
 title = {A Theory of Mutations with Applications to Vacuity, Coverage, and Fault Tolerance},
 booktitle = {Proceedings of the IEEE International Conference on Formal Methods in Computer-Aided Design (FMCAD)},
 month = "November",
 year = {2008},
 pages = "1--9",
  abstract = {The quality of formal specifications and the circuits
they are written for can be evaluated through checks such as
vacuity and coverage. Both checks involve mutations to the
specification or the circuit implementation. In this context, we
study and prove properties of mutations to finite-state systems.
Since faults can be viewed as mutations, our theory of mutations
can also be used in a formal approach to fault injection. We
demonstrate theoretically and with experimental results how
relations and orders amongst mutations can be used to improve
specifications and reason about coverage of fault tolerant circuits.},
}

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