Multi-Chip Modules: Design Methodology and CAD Aspects

Richard Newton

University of California

Multi-Chip Modules: Design Methodology and CAD Aspects

Evolution of Electronic Design Technology: Early 1980s

Evolution of Electronic Design Technology: Mid 1980s

1990 Market Segments

Profits Without Production

System Value-Added in ASICs

Evolution of Electronic Design Technology: Late 1980s

Design Technology

System-Level Performance Growth

Impact of I/C Delay on Overall System

IBM Case Study: CPU Cycle Times

MCM Impact on System Performance

Increase in I/O Pin Requirements

Package Penalties: Excess Interconnect Area

The Future of First-Level Packaging: Déja Vu?

Why Use an MCM Today?

Why Multi-Chip Subsystems?

Control the Narrows!

CANDE Predictions for 1996

CAD Needs for System Design

CAD Needs for System Design

Feature Size Trends for ICs and Boards

Why MCMs?

Why MCMs?

Typical MCM Assembly Today

Typical MCM Product Positioning

Packaging & MCM

Design Issues

Cost Implications of Process Flow

Advantages of SiO2

Advantages of SiO2

Semiconductor Issues

Technology Strategy

Packaging Issues

Test Issues

Package/Test Strategy

Integrated Subsystem Business Model

Packaging & MCM

CAD Issues for Multi-Chip Modules

CAD Issues for Multi-Chip Modules

Previous approach: lumped RLC method

Previous approach: Convolution

Convolution: Quadratic Time Complexity

Lumped RLC method: spurious responses

The State-Based Method

Example: Raytheon1

Raytheon1 Load Voltage

Example: Raytheon3

Raytheon3 Far-End crosstalk

Execution Time vs Simulation Length

Network Partitioning

Cell Replication

Cell Replication to Improve Network Partitions

Cell Replication to Improve Network Partitions

Cell Replication to Reduce Delay

Experiment 1

Results from Experiment 1

Summarized Results

Experiment 2

Results from Experiment 2